Note

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A Note on Application of Commercial Surface-Enhanced Raman Scattering Substrates in Trace Analysis
Reply to reviewers

As noted, we observed the presence of the impurity during our study of MBA deposition. Preliminary identification of BPE was done after comparison with literature data and BPE appeared in our laboratory (and also in all the Department) only after this step. Absence of the BPE in the used EtOH was proved by a simple experiment, described in Supplemental Material: Klarite chips of the batch 2009 and of the batch 2012 were separately dipped in EtOH in new (unused) weighing glasses and the Raman spectra measured without cover (i.e. undefined thickness and evaporation of EtOH during the experiment). No Teflon cell, no tubings, no re-using of solvent or chips. Development of the BPE Raman bands was noted only in the case of the batch 2009.
Please note, that without having the Klarite chips of the batch 2012, it would be very difficult to prove the contamination of the batch 2009 (we estimate that the SERS response corresponds to the BPE concentration of the order 10-14 mol/L!).
We, identically as both reviewers, were in contact with Dr. Eustace from Renishaw Diagnostics to solve the problem of the impurity, but unfortunately, we were unsuccessful to obtain a sample of the photoresist used in the production or other help.
We agree, that there is no big science behind this note. Our idea has been just communicated the problem, as probably every producer will rule out a possibility, that contamination originate from their products. Some problems with background spectra were documented earlier (see ref. ).

To the reviewer 2 response:
There are several significant reasons why the paper, “A Note on Application of ...

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... of my papers, collaborative papers that used Klarite substrates but I think they failed to look at the data presented. I have had frequent previous conversations with Dave Eustace and Alastair McInroy (renishaw diagnostics, previously D3 technologies who make Klarite substrates) regarding the Klarite substrate manufacturing, they do not have BPE rampantly about in the production process. Additionally, never has a BPE background been discussed, hinted at, or measured by myself or colleagues in academia (UMBC) or other govt facilities (ARL, ECBC). Generally, the authors make a good point that it is necessary to understand the background of your substrate (true for all analytical techniques), but they completely fail at understanding that they are contaminating their own material. We are presenting good data showing that contamination is on the Klarite chip.

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