Introduction:
Scanning probe microscopy in nano mechanical testing has started with the invention of the scanning tunneling microscope in the year 1981. Till then based on the type of principles there are number of models developed and are in use. Scanning probe microscopy found popularity owing to its ease in versatility in dealing with a number of issues, typically it is used to identify the material properties on nano to even pico scales. Scanning probe microscopy techniques such as atomic/friction force microscopy(AFM/FFM) are increasingly finding applications in tribological studies of engineering surfaces as well for finding surface texture etc. Atomic and molecular level details can be assessed using Scanning probe microscopy with great ease and the instruments are highly versatile. AFMs with suitable tips are being used to study issues like scratching, wear etc. Scratch and wear properties of variety of materials have been measured. Mechanisms of material removal are also studied. Localized surface elasticity maps of composite materials with penetration depths less than 10nm can be found using SPM with nano mechanical testing procedures. Nano indentation hardness and the young’s modulus of elasticity can be measured with a depth of indentation as low as 1nm. Scratching and indentation on the nano scale are powerful ways to screen for adhesion and resistance to deformation of ultrathin coatings. These studies provide insight into failure mechanisms of the materials and thin coatings. SPM in nano mechanical testing provides insight into the surface characterization and provided glimpse of failure mechanisms study. (Bhushan, 2001). The manner of using interactions between the probe and the surface to obtain an image is gene...
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...scopy to the characterization and fabrication of hybrid nano materials. al, M. E. (2004). Nano material characterization using scanned microscopy. al, M. M. (2011). Scanning probe microscopy: Measuring on hard surfaces. NanoCon. Czech Republic: NaonCon. al, N. m. (2012). Advances in manufacturing of molded tips for scaning probe microscopy. ASME journal of micro electro mechanical systems , 431-442. al, V. m. (2012). long range scanning probe microscopy applications in local mechanical analysis. NanoCon . Czech Republic: NanoCon.
Bhushan, B. (2001). Nano to microscale wear and mechanical characterization using scanning probe microscopy. Wear , 1105-1123.
Nano material characterization using scanning probe microscopy. , Mc grawhill publications, NewDelhi,2009.
Scanning probe microscopy (al k. e., 2007)
Bhushan, B. (2011). Nano tribology and nano mechanics. Springer.
Thermal methods of analysis have been in use for quite a long time. Their application in the analysis of pharmaceutical materials has made it possible for pharmacists and researchers to understand their contents and characteristics. However, thermal methods have several disadvantages that have led researchers to opt for nano-thermal methods of analysis. Nano-thermal analysis methods use special resolution imaging potential that is enhanced by the availability of atomic force microscopy and thermal analysis methods.
In order to perform the micro hardness test on the samples, they were first roughly polished using belt grinder. Then they were polished with the Emery papers as described in previous descriptions so as to obtain flat surfaces and to avoid anomalies in the results.
For this scope of this assignment a study in the surface modification of a titanium alloy stem, used in a hip joint implant is going to be studied. A total hip joint implant consists of an articulating bearing basically the femoral head and cup and the stem. The stem is made from titanium alloy - Ti- 6Al- 4V where titanium is alloyed with aluminium and vanadium. When titanium is alloyed with these materials excellent properties are achieved such as high strength-to-weight ratio and exceptional corrosion resistance.2 However, this alloy gives poor tribological properties and tends to seize when it is subjected to sliding motion due to its low hardness of 36HRC.3 Several surface modification techniques are done on ti...
Alford, Terry L., L. C. Feldman, and James W. Mayer. Fundamentals of Nanoscale Film Analysis. New York: Springer, 2007. Print.
The electron microscope has become one of the most widely utilized instruments for materials characterization. An electron microscope is a scientific instrument that allows us to “see” objects so small that they cannot be seen in any other way. (CITE) Electron microscopes have allowed scientists to see individual molecules and atoms for the first time.
Machine tool probes used to measure workpieces on milling machines, machining centers, lathes, turning/milling machine, grinding machines and robot. Whether the business is small, middle or large workpiece is not only aligned but also the geometries are inspected. Machine tool probes are used to inspect the workpiee and reduce the manufacturing time and cost and increase capabilities. Probe types in hexagon metrology of m&h are of several types like infrared, radiowave, production probes along with necessary software and applications support. In this chapter we are going to discuss different models of infrared probes.
Berkeley Lab. (2009). Berkeley Lab: Plasmonic Whispering Gallery Microcavity Paves the Way to Future Nanolasers. [Online]. Available: http://newscenter.lbl.gov/press-releases/2009/01/22/plasmonic-whispering-gallery-microcavity-paves-the-way-to-future-nanolasers/ [19 July 2009].
The scanning electron microscope has 10 parts to it which are the secondary detector, x-ray detector, backscatter detector, sample chamber, objective lens, electron beam, condenser lens, anode, ...
In fabrication micro-sensors and devices micro-electro-mechanical systems (MEMS) provides significant opportunities, which are borrowed it fabrication abilities from semiconductor technology.
A study was recently released that imaged atoms in a different way than what is usually done. What this group in America did was to take a sheet of graphene which is a single layer of carbon atoms, very similar to a honeycomb which all stack up to make graphite. When you peel away layers of graphite you get graphene. They then sprinkled molecules over the layer of graphene and ran a tunnelling electron microscope across the surface (function of the microscope explained in source 2), and because the graphene is very consistent and regular in its structure, it is very easy to subtract any effects that the graphene may be causing away from any other signals that you get. This enabled the group to actually see the structure and shapes of the molecules.
The objectives were to identify the parts and functions of a compound microscope, learn to adjust the microscope for viewing biological specimens, and to learn to measure small objects using the principles of microscopy.
Several different mechanisms have been proposed to describe the manner in which the material is removed. Three commonly identified mechanisms of abrasive wear are:
Grundmann, Marius. Physics of Semiconductors: An Introduction Including Devices and Nanophysics. New York: Springer, 2006. Print.
Figure 1: Image of the nanoscale, this illustration shows how small things at the nanoscale really are (nano.gov, 2013).
To optimize the properties of nano-material and atomic level needs an elemental probe with resolution of <1nm. The nano scale probe helpful to provide the reproducible control over defects.